Author:
Terasawa Tomohito,Kamiya Yuji,Kawashima Hiroyuki,Imai Kenichiro,Suzuki Masanobu,Watanabe Takamoto,Taguchi Nobuyuki,Sawada Manabu,Hou Yu,Hirooka Yoshiyuki,Phuc Ninh Hong,Miyahara Masaya,Matsuzawa Akira
Cited by
2 articles.
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1. All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS;2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS);2021-11-28
2. All-Digital VCO-ADC TAD Using 4CKES-Type in 16-nm FinFET CMOS for Technology Scaling With Stochastic-ADC Method;2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS);2021-11-28