Reducing bit flipping problems in SRAM physical unclonable functions for chip identification-Reference-Cited by-同舟云学术

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Reducing bit flipping problems in SRAM physical unclonable functions for chip identification

Published:2012-12 Issue: Volume: Page:
ISSN:
Container-title:2012 19th IEEE International Conference on Electronics, Circuits, and Systems (ICECS 2012)
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Author:

Eiroa S.,Castro J.,Martinez-Rodriguez M. C.,Tena E.,Brox P.,Baturone I.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6450169/6463499/06463720.pdf?arnumber=6463720

Cited by 15 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SRAM-cells Reproducibility Metrics for Physical Unclonable Function Applications;2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS);2022-11-16

2. A Novel Ultra-Compact FPGA PUF: The DD-PUF;Cryptography;2021-09-08

3. Resilient Password Manager Using Physical Unclonable Functions;IEEE Access;2021

4. Feasibility of PUF-Based Authentication on ATtiny Devices with Off-the-Shelf SRAM;Proceedings of the 6th ACM on Cyber-Physical System Security Workshop;2020-10-06

5. Assessment of False Identity by Variability in Operating Condition for Memristor Write Time-Based Device Fingerprints;Computational Collective Intelligence;2020

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