Author:
Moore W.,Gronthoud G.,Baker K.,Lousberg M.
Cited by
25 articles.
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1. Non-Uniform Coverage by $n$-Detection Test Sets;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2012-11
2. Gate Leakage Impact on Full Open Defects in Interconnect Lines;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2011-12
3. VLSI interconnects and their testing: prospects and challenges ahead;Journal of Engineering, Design and Technology;2011-03-29
4. Test and Diagnostic Trends for Nanometer Technology;IETE Technical Review;2010
5. Open Defects in Nanometer Technologies;Models in Hardware Testing;2009-10-27