Author:
Re Valerio,Gaioni Luigi,Manazza Alessia,Manghisoni Massimo,Ratti Lodovico,Traversi Gianluca
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
6 articles.
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1. Heavy ion and proton induced single event upsets in 3D SRAM;Microelectronics Reliability;2020-11
2. Evaluation Method of Heavy-Ion-Induced Single-Event Upset in 3D-Stacked SRAMs;Electronics;2020-07-30
3. Development of monolithic sensors for high energy physics in commercial CMOS technologies;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2019-09
4. Monolithic CMOS sensors for high energy physics;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2019-04
5. SEE on Different Layers of Stacked-SRAMs;IEEE Transactions on Nuclear Science;2015-12