Machine Learning-based Prediction of Test Power-Reference-Cited by-同舟云学术

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Machine Learning-based Prediction of Test Power

Published:2019-05 Issue: Volume: Page:
ISSN:
Container-title:2019 IEEE European Test Symposium (ETS)
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Author:

Dhotre Harshad,Eggersglub Stephan,Chakrabarty Krishnendu,Drechsler Rolf

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8784130/8791505/08791548.pdf?arnumber=8791548

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Thermal-Aware Test Frequency Optimization;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

2. A Novel and Accurate Transient Power Simulation Method Suitable for Gate-level Physical Design;2024 4th International Conference on Electronics, Circuits and Information Engineering (ECIE);2024-05-24

3. An efficient algorithm for estimating gate-level power consumption in large-scale integrated circuits;Microelectronics Journal;2024-04

4. High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns;2023 IEEE International Test Conference (ITC);2023-10-07

5. Machine Learning and Its Applications in Test;Machine Learning Support for Fault Diagnosis of System-on-Chip;2023

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