A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance-Reference-Cited by-同舟云学术

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A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance

Published:2022-06 Issue:2 Volume:22 Page:223-231
ISSN:1530-4388
Container-title:IEEE Transactions on Device and Materials Reliability
language:
Short-container-title:IEEE Trans. Device Mater. Relib.

Author:

Li Jie¹,Xiao Liyi¹^ORCID,Li Hongchen¹^ORCID,Cao Xuebing¹^ORCID,Wang Chenxu¹

Affiliation:

1. Microelectronics Center, Harbin Institute of Technology, Harbin, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/7298/9789687/09739755.pdf?arnumber=9739755

Reference41 articles.

1. Charge Collection and Charge Sharing in a 130 nm CMOS Technology

2. Novel Low-Power and Highly Reliable Radiation Hardened Memory Cell for 65 nm CMOS Technology

3. Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

4. Radiation-Induced Soft Error Rates of Advanced CMOS Bulk Devices

5. Multiple transient faults in logic: an issue for next generation ICs?

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2. Temperature-Insensitive Soft-Error-Tolerant Flip-Flop Design For Automotive Electronics;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

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4. Design and Analysis of Latches Using RHBD Technology;2023 9th International Conference on Smart Structures and Systems (ICSSS);2023-11-23

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