The Effect of Noise Cross-Coupling on Time-Interleaved Delta-Sigma ADCs
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Link
http://xplorestaging.ieee.org/ielx5/8920/4545018/04472699.pdf?arnumber=4472699
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A 70MHz Bandwidth Time-Interleaved Noise-Shaping SAR Assisted Delta Sigma ADC with Digital Cross-Coupling in 28nm CMOS;ESSCIRC 2023- IEEE 49th European Solid State Circuits Conference (ESSCIRC);2023-09-11
2. A triple-mode hexa-standard reconfigurable TI cross-coupled ΣΔ modulator;International Journal of Electronics;2017-03
3. Enhanced Noise Shaping based Band-Pass Cross-Coupled Sigma Delta Modulators for Advanced Wireless Transceivers;PROCEDIA COMPUT SCI;2015
4. Overloading Prediction in Symmetric Cross Coupled Low-Pass Sigma Delta Modulators;PROCEDIA COMPUT SCI;2015
5. Dual Extended Noise Shaping for High Performance Cross-Coupled Sigma-Delta Modulators;2014 Eighth International Conference on Next Generation Mobile Apps, Services and Technologies;2014-09
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