Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. ASIC vs FPGA based Implementations of Built-In Self-Test;International Journal of Advanced Natural Sciences and Engineering Researches;2023-07-13
2. Low-power test pattern generator using modified LFSR;Aerospace Systems;2023-01-09
3. Low-Power and Space-Efficient Built In Self-Test Architecture With MSIC Test Pattern Generator;Journal of Population Therapeutics and Clinical Pharmacology;2023-01-01
4. Weighted test pattern generator (TPG) for built-in self-test (BIST);LOW RADIOACTIVITY TECHNIQUES 2022 (LRT 2022): Proceedings of the 8th International Workshop on Low Radioactivity Techniques;2023
5. Research on Low Power BIST Based on LFSR Reseeding;Academic Journal of Science and Technology;2022-10-28