Memristive CNN for Wafer defect detection
Author:
Affiliation:
1. Maker Village, IIITMK
2. Digital University,Kerala
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9937201/9937203/09937406.pdf?arnumber=9937406
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1. Memristor-based memory: The sneak paths problem and solutions
2. Analog circuit for softmax function;newns,2020
3. Predicting machine failure using recurrent neural network-gated recurrent unit (rnn-gru) through time series data;zainuddin;Bulletin of Electrical Engineering and Informatics,2021
4. Gated Recurrent Units Viewed Through the Lens of Continuous Time Dynamical Systems
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