Test Response Compaction for Software-Based Self-Test
Author:
Affiliation:
1. Graduate Institute of Electronics Engineering
Funder
Ministry of Science and Technology of Taiwan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9946294/9946242/09946335.pdf?arnumber=9946335
Reference18 articles.
1. Software-Based Self-Test for Small Caches in Microprocessors
2. A flexible framework for the automatic generation of SBST programs;riefert;IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2011
3. Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors
4. Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors
5. An evolutionary approach for test program compaction
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1. BDD-Based Self-Test Program Generation for Processor Cores;2023 IEEE International Test Conference in Asia (ITC-Asia);2023-09-12
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