Testing in VLSI: A survey-Reference-Cited by-同舟云学术

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Testing in VLSI: A survey

Published:2016-02 Issue: Volume: Page:
ISSN:
Container-title:2016 International Conference on Emerging Trends in Engineering, Technology and Science (ICETETS)
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Author:

Rinitha R,Ponni R

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7585855/7602971/07603068.pdf?arnumber=7603068

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Explainability to the Rescue: A Pattern-Based Approach for Detecting Adversarial Attacks;2024 IEEE International Symposium on Hardware Oriented Security and Trust (HOST);2024-05-06

2. An Improved switching activity optimised LFSR for energy efficient BIST applications;2023 2nd International Conference on Vision Towards Emerging Trends in Communication and Networking Technologies (ViTECoN);2023-05-05

3. Implementation of Monotonicity Testing Utilizing On Chip Resources for Test Time Reduction;2022 IEEE International Test Conference India (ITC India);2022-07-24

4. Low Transition Dual LFSR for Low Power Testing;Lecture Notes in Networks and Systems;2020-09-25

5. Efficient detection of transistor stuck-on faults in CMOS circuits using low-overhead single-ended ring oscillators;Journal of Computational Electronics;2020-07-27

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