Author:
Tausch Jake,Sleeter David,Radaelli Daniele,Puchner Helmut
Cited by
17 articles.
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1. Experimental Study of Transient Dose Rate Effect on System-in-Package SZ0501;IEEE Transactions on Nuclear Science;2022-08
2. Single-Event Latchup Vulnerability at the 7-nm FinFET Node;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03
3. Radiation Effects on Digital Devices;Approximate Computing and its Impact on Accuracy, Reliability and Fault-Tolerance;2022
4. Introduction;Approximate Computing and its Impact on Accuracy, Reliability and Fault-Tolerance;2022
5. Approximate Computing for Fault Tolerance Mechanisms for Safety-Critical Applications;Approximate Computing Techniques;2022