All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis
Author:
Affiliation:
1. Iowa State University,Dept. Electrical and computer Engineering,Iowa,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9793839/9794139/09794271.pdf?arnumber=9794271
Reference10 articles.
1. SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety
2. A Novel Method for the Diagnosis of the Incipient Faults in Analog Circuits Based on LDA and HMM
3. Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage
4. A Fully-Digital BIST Wrapper Based on Ternary Test Stimuli for the Dynamic Test of a 40 nm CMOS 18-bit Stereo Audio $\Sigma\Delta$ ADC
5. Built-in-self-test and foreground calibration of SAR ADCs;varier;PhD diss,2017
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