The influence of calibration substrate boundary conditions on CPW characteristics and calibration accuracy at mm-wave frequencies
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Publisher
IEEE
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http://xplorestaging.ieee.org/ielx5/4801867/4804274/04804293.pdf?arnumber=4804293
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2. Validity of Room-temperature Calibration for On-wafer Measurements up to 220 GHz, 125 °C, and 48 h;2023 101st ARFTG Microwave Measurement Conference (ARFTG);2023-06-16
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5. Long-Term Stability Test on On-Wafer Measurement System in Frequency Ranges up to 325 GHz;IEEE Transactions on Instrumentation and Measurement;2021
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