110 GHz on-wafer measurement comparison on alumina substrate-Reference-Cited by-同舟云学术

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110 GHz on-wafer measurement comparison on alumina substrate

Published:2017-11 Issue: Volume: Page:
ISSN:
Container-title:2017 90th ARFTG Microwave Measurement Symposium (ARFTG)
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Author:

Probst Thorsten¹,Doerner Ralf²,Ohlrogge Matthias³,Lozar Roger³,Arz Uwe¹

Affiliation:

1. Physikalisch-Technische Bundesanstalt - PTB, Braunschweig, Germany

2. Ferdinand-Braun-Institut, Leibniz-Institut für Höchstfrequenztechnik - FBH, Berlin, Germany

3. Fraunhofer-Institut fur Angewandte Festkörperphysik - IAF, Freiburg i.Br., Germany

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/8242198/8255862/08255867.pdf?arnumber=8255867

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 110–170 GHz On-Chip Calibration Using Deep Neural Networks;IEEE Transactions on Circuits and Systems I: Regular Papers;2024-05

2. Radiation behaviour of mm‐wave on‐wafer probes in H‐band and the influence on antenna measurements;Electronics Letters;2024-02

3. Improving the Precision of On-Wafer W-Band Scalar Load-Pull Measurements;IEEE Journal of Microwaves;2023-07

4. Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides;Advances in Radio Science;2023-04-27

5. Demonstration of in-situ dielectric permittivity measurement using precision probing technique;Japanese Journal of Applied Physics;2018-08-28

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