Radiation behaviour of mm‐wave on‐wafer probes in H‐band and the influence on antenna measurements-Reference-Cited by-同舟云学术

Radiation behaviour of mm‐wave on‐wafer probes in H‐band and the influence on antenna measurements

Published:2024-02 Issue:3 Volume:60 Page:
ISSN:0013-5194
Container-title:Electronics Letters
language:en
Short-container-title:Electronics Letters

Author:

Hebeler Joachim¹^ORCID,Zwick Thomas¹,Bhutani Akanksha¹^ORCID

Affiliation:

1. Institute of Radio Frequency Engineering and Electronics Karlsruhe Institute of Technology Karlsruhe Germany

Abstract

AbstractThis letter presents a comprehensive analysis of the radiation behaviour exhibited by nine distinct on‐wafer radio‐freqeuncy (RF) probes used for device characterization in the mm‐wave bands of integrated circuits and antennas. The tested probes are sourced from two different manufacturers and feature various probe pitches. All probes are intended for use with the WR‐3.4 waveguide band ranging from 220 to 330 GHz. To the best of the authors' knowledge, such a detailed examination of RF probes operating in this band with respect to their radiation behaviour has not been demonstrated before.

Funder

Bundesministerium für Bildung und Forschung

Deutsche Forschungsgemeinschaft

Publisher

Institution of Engineering and Technology (IET)

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