Functional test generation for synchronous sequential circuits-Reference-Cited by-同舟云学术

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Functional test generation for synchronous sequential circuits

Published:1996-07 Issue:7 Volume:15 Page:831-843
ISSN:0278-0070
Container-title:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
language:
Short-container-title:IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

Author:

Srinivas M.K.,Jacob J.,Agrawal V.D.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software

Link

http://xplorestaging.ieee.org/ielx1/43/10991/00503950.pdf?arnumber=503950

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improved Design Verification by Random Simulation Guided by Genetic Algorithms;System-on-Chip Methodologies & Design Languages;2001

2. A graph representation for programmable logic arrays to facilitate testing and logic design;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;1998

3. Testing core-based systems: a symbolic methodology;IEEE Design & Test of Computers;1997

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