Defects tail off with six-sigma manufacturing
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx1/101/2819/00086129.pdf?arnumber=86129
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2. A six sigma based approach to evaluate the on time performance of Indian railways;International Journal of Quality & Reliability Management;2018-11-29
3. Stress-induced voiding in nickel silicide;Microelectronic Engineering;2013-06
4. A Framework for Modeling Impact of Intrinsic Parameter Fluctuations at Architectural-Level;2009 International Conference on Signal Processing Systems;2009
5. An IC yield enhancement approach by ARMA modeling and dynamic process control;The International Journal of Advanced Manufacturing Technology;2008-07-30
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