Extraction of Stripline Surface Roughness Using Cross-section Information and S-parameter Measurements
Author:
Affiliation:
1. Missouri University of S&T,EMC Laboratory,Rolla,USA
2. Cadence Design Systems,San Jose,USA
Funder
National Science Foundation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9889328/9889311/09889527.pdf?arnumber=9889527
Reference16 articles.
1. Dielectric Loss Tangent Extraction Using Modal Measurements and 2-D Cross-Sectional Analysis for Multilayer PCBs
2. A novel de-embedding method suitable for transmission-line measurement
3. Multi-Ports ([$2^{n}$) 2×-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization
4. Differential S-Parameter De-embedding for 8-Port Network
5. Semi-automatic copper foil surface roughness detection from PCB microsection images
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Effects of Non-Gaussian Surface Roughness on Conductor Loss in High-Frequency Transmission Lines;IEEE Transactions on Components, Packaging and Manufacturing Technology;2024-05
2. Extraction of Transmission Line Surface Roughness Using S-Parameter Measurements and Cross-Sectional Information;IEEE Transactions on Signal and Power Integrity;2024
3. Characterization of a Microstrip Line Referenced to a Meshed Return Plane Using 2-D Analysis;IEEE Transactions on Signal and Power Integrity;2024
4. Modeling of a Microstrip Line Referenced to a Meshed Return Plane;2023 IEEE Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMC+SIPI);2023-07-29
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3