Multi-Ports ([$2^{n}$) 2×-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization-Reference-Cited by-同舟云学术

Multi-Ports ([$2^{n}$) 2×-Thru De-Embedding: Theory, Validation, and Mode Conversion Characterization

Published:2019-08 Issue:4 Volume:61 Page:1261-1270
ISSN:0018-9375
Container-title:IEEE Transactions on Electromagnetic Compatibility
language:
Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Chen Bichen,He Jiayi,Guo Yuandong,Pan Siming,Ye Xiaoning^ORCID,Fan Jun^ORCID

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

https://ieeexplore.ieee.org/ielaam/15/8798901/8703396-aam.pdf

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