Extracting Device Parameters of TFTs With Ultrathin Channels at Low Temperatures by Particle Swarm Optimization-Reference-Cited by-同舟云学术

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Extracting Device Parameters of TFTs With Ultrathin Channels at Low Temperatures by Particle Swarm Optimization

Published:2024-08 Issue:8 Volume:71 Page:4717-4722
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Chen Y.-C.¹^ORCID,Chou J.-P.²^ORCID,Chen K.-C.¹^ORCID,Lin J.-Y.¹,Ma W. C.-Y.³^ORCID,Kao K.-H.¹^ORCID,Chiang M.-H.¹^ORCID,Wang Y.-H.¹^ORCID

Affiliation:

1. Department of Electrical Engineering, National Cheng Kung University, Tainan, Taiwan

2. Department of Physics, National Changhua University of Education, Changhua, Taiwan

3. Department of Electrical Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan

Funder

National Science and Technology Council, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx8/16/10609410/10591498.pdf?arnumber=10591498

Reference33 articles.

1. Novel LTPS-TFT Pixel Circuit with OLED Luminance Compensation for 3D AMOLED Displays

2. Nonvolatile Poly-Si TFT Charge-Trap Flash Memory With Engineered Tunnel Barrier

3. Performances of a Capacitorless 1T-DRAM Using Polycrystalline Silicon Thin-Film Transistors With Trenched Body

4. Threshold voltage-related soft error degradation in a TFT SRAM cell

5. Monolithic 3D-ICs with single grain Si thin film transistors

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