Review of Back-Side Illuminated 3-D-Stacked SPADs for Time-of-Flight and Single-Photon Imaging-Reference-Cited by-同舟云学术

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Review of Back-Side Illuminated 3-D-Stacked SPADs for Time-of-Flight and Single-Photon Imaging

Published:2024-06 Issue:6 Volume:71 Page:3470-3477
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Wojtkiewicz Maciej¹^ORCID,Rae Bruce²,Henderson Robert K.¹^ORCID

Affiliation:

1. School of Engineering, Institute for Integrated Micro and Nano Systems, University of Edinburgh, Edinburgh, U.K.

2. Imaging Division, STMicroelectronics, Edinburgh, U.K.

Funder

STMicroelectronics

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Link

http://xplorestaging.ieee.org/ielx7/16/10538150/10507861.pdf?arnumber=10507861

Reference57 articles.

1. Avalanche photodiodes and quenching circuits for single-photon detection

2. Principles and features of single-photon avalanche diode arrays

3. Recent Advances and Future Perspectives of Single‐Photon Avalanche Diodes for Quantum Photonics Applications

4. Single-photon avalanche diode detectors based on group IV materials

5. Comparison of iPad Pro®’s LiDAR and TrueDepth Capabilities with an Industrial 3D Scanning Solution

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