Panel-Level Chip-Scale Package With Multiple Diced Wafers

Author:

Lau John H.ORCID,Ko Cheng-Ta,Tseng Tzyy-Jang,Yang Kai-Ming,Peng Tony Chia-Yu,Xia Tim,Lin Puru Bruce,Lin EagleORCID,Chang Leo,Liu Hsing Ning,Cheng David

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Literature Review: Global Criticality Assessment Based on Feature Surrogates at the PCBA Levels;2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2024-04-07

2. Finite Element Simulation of Sn-Ag-Cu Solder Joint Reliability Under Thermoelectric Coupling;Journal of Electronic Materials;2023-08-29

3. Application of AI-enabled Simulation in Power Package Development;2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE);2023-04-17

4. Recent Advances and Trends in Advanced Packaging;IEEE Transactions on Components, Packaging and Manufacturing Technology;2022-02

5. An Overview of AI-Assisted Design-on-Simulation Technology for Reliability Life Prediction of Advanced Packaging;Materials;2021-09-16

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