Fast and Distributed Thermal Model for Thermal Modeling of GaN Power Devices
Author:
Affiliation:
1. imec, Leuven, Belgium
2. Center for Applied Microstructure Diagnostics, Fraunhofer Institute for Microstructure of Materials and Systems, Halle, Germany
3. Department of Mechanical Engineering, KU Leuven, Leuven, Belgium
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/5503870/8488701/08315476.pdf?arnumber=8315476
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