A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction-Reference-Cited by-同舟云学术

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A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction

Published:2007-09 Issue: Volume: Page:
ISSN:
Container-title:22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007)
language:
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Author:

Hellebrand Sybille¹,Zoellin Christian G.²,Wunderlich Hans-Joachim²,Ludwig Stefan³,Coym Torsten³,Straube Bernd³

Affiliation:

1. University of Paderborn

2. University of Stuttgart

3. Fraunhofer IIS-EAS Dresden

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4358358/4358359/04358372.pdf?arnumber=4358372

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of the Endurance of CMOS IC Elements to Failures after Charged Particle Strike;2022 Conference of Russian Young Researchers in Electrical and Electronic Engineering (ElConRus);2022-01-25

2. Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch;Journal of Electronic Testing;2015-06

3. Algorithmen-basierte Fehlertoleranz für Many-Core-Architekturen;it - Information Technology;2010-07-26

4. Verification and Analysis of Self-Checking Properties through ATPG;2008 14th IEEE International On-Line Testing Symposium;2008-07

5. Bewertung und Verbesserung der Zuverlässigkeit von mikroelektronischen Komponenten in mechatronischen Systemen;Zuverlässigkeit mechatronischer Systeme

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