Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets-Reference-Cited by-同舟云学术

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Susceptibility Analysis of LEON3 Embedded Processor against Multiple Event Transients and Upsets

Published:2012-12 Issue: Volume: Page:
ISSN:
Container-title:2012 IEEE 15th International Conference on Computational Science and Engineering
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Author:

Abbasitabar Hamed,Zarandi Hamid R.,Salamat Ronak

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6415461/6417266/06417340.pdf?arnumber=6417340

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