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Springer Nature Switzerland
Link
https://link.springer.com/content/pdf/10.1007/978-3-031-18599-1_3
Reference98 articles.
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2. Mansour, W., Velazco, R.: SEU fault-injection in VHDL-based processors: a case study. J. Electron. Test. 29(1), 87–94 (2013). https://doi.org/10.1007/s10836-013-5351-6
3. Abbasitabar, H., Zarandi, H.R., Salamat, R.: Susceptibility analysis of LEON3 embedded processor against multiple event transients and upsets. In: International Conference on Computational Science and Engineering (CSE), pp. 548–553 (2012). https://doi.org/10.1109/ICCSE.2012.81
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