A Clock Fault Detection Circuit for Reliable High Speed System by Time-to-Voltage Conversion-Reference-Cited by-同舟云学术

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A Clock Fault Detection Circuit for Reliable High Speed System by Time-to-Voltage Conversion

Published:2009 Issue: Volume: Page:
ISSN:
Container-title:2009 Second International Symposium on Electronic Commerce and Security
language:
Short-container-title:

Author:

Yu Changhong

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5209635/5209636/05209818.pdf?arnumber=5209818

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. An Autonomous Clock Frequency Supervision Circuit;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03

2. Generation of a fault-tolerant clock through redundant crystal oscillators;Microelectronics Reliability;2021-05

3. Merging Redundant Crystal Oscillators into a Fault-Tolerant Clock;2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2020-04

4. A Systematic Approach to Clock Failure Detection;2019 Austrochip Workshop on Microelectronics (Austrochip);2019-10

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