A Data-Driven Inductor Modeling Technique Using Parametric Circuit Simulation and Deep Learning
Author:
Affiliation:
1. Kagoshima University,Kagoshima,Japan,890-0065
2. Nagasaki University,Nagasaki,Japan,852-8521
3. Tohoku University,Sendai,Japan,980-8579
4. Ryowa Electronics Co., LTD,Sendai,Japan,984-0805
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10228191/10228192/10228481.pdf?arnumber=10228481
Reference6 articles.
1. Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices
2. Geometry Effects on Magnetic Core Losses;aguaron;Power Magnetics High Frequency Workshop,2022
3. High Frequency Magnetics: Black Magic, Art or Science? Magnetics Core Loss;ridley;IS09 1 APEC,2016
4. A fractal model of anomalous losses in ferromagnetic materials
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