Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices-Reference-Cited by-同舟云学术

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Triple Pulse Test (TPT) for Characterizing Power Loss in Magnetic Components in Analogous to Double Pulse Test (DPT) for Power Electronics Devices

Published:2020-10-18 Issue: Volume: Page:
ISSN:
Container-title:IECON 2020 The 46th Annual Conference of the IEEE Industrial Electronics Society
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Author:

Wang Jun,Yuan Xibo,Rasekh Navid

Funder

Royal Academy of Engineering

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9254213/9254215/09255039.pdf?arnumber=9255039

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Method and a Three-Source Converter for Medium-Frequency Magnetic Elements Losses Measurement;IEEE Transactions on Industrial Electronics;2023-12

2. A Data-Driven Inductor Modeling Technique Using Parametric Circuit Simulation and Deep Learning;IEEE Transactions on Magnetics;2023-11

3. An Introduction to Power Electronics Design Methodology;2023 IEEE Design Methodologies Conference (DMC);2023-09-24

4. A Data-Driven Inductor Modeling Technique Using Parametric Circuit Simulation and Deep Learning;2023 IEEE International Magnetic Conference - Short Papers (INTERMAG Short Papers);2023-05

5. A Tutorial on Double Pulse Test of Silicon and Silicon Carbide MOSFETs;2023 IEEE Workshop on Electrical Machines Design, Control and Diagnosis (WEMDCD);2023-04-13

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