On the Susceptibility of SRAM-Based FPGA Routing Network to Delay Changes Induced by Ionizing Radiation

Author:

Darvishi MostafaORCID,Audet YvesORCID,Blaquiere YvesORCID,Thibeault ClaudeORCID,Pichette Simon

Funder

Innovation, Science and Economic Development Canada

CARIC Funding Agreement EPICEA

Natural Sciences and Engineering Research Council of Canada

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays;Sensors;2024-08-19

2. Characterization of Interconnect Fault Effects in SRAM-based FPGAs;2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS);2023-05-03

3. Bitstream- Level Interconnect Fault Characterization for SRAM-based FPGAs;2023 Design, Automation & Test in Europe Conference & Exhibition (DATE);2023-04

4. Multi-level energy efficient cooperative scheme for ring based clustering in wireless sensor network;Energy Harvesting and Systems;2022-04-13

5. Energy conserving ring cluster‐based routing protocol for wireless sensor network: A hybrid based model;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2021-06-22

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