Extracting mu /sub r/ and epsilon /sub r/ of solids from one-port phasor network analyzer measurements
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx1/19/2074/00057244.pdf?arnumber=57244
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
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2. A New Calibration Algorithm Using Reference Materials for the Waveguide-Penetration Method;IEICE Transactions on Communications;2011
3. Scattering Analysis for Layered Cylindrical Object Perpendicularly Piercing the Wider Walls of a Rectangular Waveguide and Its Application to ${\varepsilon _{r}}$ and ${\mu _{r}}$ Measurement;IEEE Transactions on Microwave Theory and Techniques;2009-06
4. A Swept-Frequency Measurement of Complex Permittivity and Complex Permeability of a Columnar Specimen Inserted in a Rectangular Waveguide;IEEE Transactions on Microwave Theory and Techniques;2007-07
5. Loss-Angle Measurement;Wiley Encyclopedia of Electrical and Electronics Engineering;1999-12-27
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