A New Calibration Algorithm Using Reference Materials for the Waveguide-Penetration Method

Author:

KIK Alfred1,NISHIKATA Atsuhiro1

Affiliation:

1. Tokyo Institute of Technology

Publisher

Institute of Electronics, Information and Communications Engineers (IEICE)

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Software

Reference22 articles.

1. [1] A.R. Von Hippel, Dielectric Materials and Applications, MIT Press, Cambridge, MA, 1954.

2. [2] A.M. Nicolson and G.F. Ross, “Measurement of the intrinsic properties of materials by time-domain techniques,” IEEE Trans. Instrum. Meas., vol.19, no.11, pp.377-382, Nov. 1970.

3. Automatic measurement of complex dielectric constant and permeability at microwave frequencies

4. Extracting mu /sub r/ and epsilon /sub r/ of solids from one-port phasor network analyzer measurements

5. [5] J. Baker-Jarvis, M. Janezic, J. Grosvenor, and R. Geyer, “Transmission/reflection and short-circuit line methods for measuring permittivity and permeability,” Natl. Inst. Stand. Technol., Tech. Note 1355-R, 1993.

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