Analysis of Machine Learning Techniques for Time Domain Waveform Prediction in Analog and Mixed Signal Integrated Circuit Verification-Reference-Cited by-同舟云学术

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Analysis of Machine Learning Techniques for Time Domain Waveform Prediction in Analog and Mixed Signal Integrated Circuit Verification

Published:2023-04-05 Issue: Volume: Page:
ISSN:
Container-title:2023 24th International Symposium on Quality Electronic Design (ISQED)
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Author:

V Dhanasekar¹,Gunasekaran Vinodhini¹,Challa Anusha¹,Srinivasan Bama¹,Devi J Dhurga¹,Ravindran Selvi¹,Parthasarathi Ranjani¹,Ramakrishna P V¹,Geetha Kumar Gopika²,Padmanabhan Venkateswaran³,Lakshmanan Guha³,Balasubramanian Lakshmanan³

Affiliation:

1. Anna University,College of Engineering, Guindy Campus

2. Carnegie Mellon University

3. Texas Instruments (India) Private Limited

Funder

Semiconductor Research Corporation

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10129281/10129282/10129327.pdf?arnumber=10129327

Reference20 articles.

1. Understanding operational amplifier specifications;j;Mixed Signal and Analog Operational Amplifiers Digital Signal Processing Solutions White Paper SLOA011 Texas Instruments,1998

2. Auxiliary state machines + context-triggered properties in verification

3. A Modern Introduction to Probability and Statistics

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Machine Learning based Waveform Predictions using Discrete Wavelet Transform for Automated Verification of Analog and Mixed Signal Integrated Circuits;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06

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