Derivation of Ambient Enhancement Factors of Impregnated Twisted pairs for Partial Discharge Risk Evaluation-Reference-Cited by-同舟云学术

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Derivation of Ambient Enhancement Factors of Impregnated Twisted pairs for Partial Discharge Risk Evaluation

Published:2023 Issue: Volume: Page:1-1
ISSN:2332-7782
Container-title:IEEE Transactions on Transportation Electrification
language:
Short-container-title:IEEE Trans. Transp. Electrific.

Author:

Ji Yatai¹^ORCID,Giangrande Paolo²^ORCID,Zhao Weiduo¹^ORCID,Madonna Vincenzo³^ORCID,Zhang He¹^ORCID,Galea Michael⁴^ORCID

Affiliation:

1. Key Laboratory of More Electric Aircraft Technology of Zhejiang Province, University of Nottingham Ningbo China, Ningbo, China

2. Department of Engineering and Applied Sciences, University of Bergamo, Dalmine (BG), Italy

3. Advanced Engineering, PUNCH Torino S.p.A., Turin, Italy

4. Department of Electrical Engineering, University of Malta, Msida Msd, Malta

Funder

National Key R&D Program of China

Foundation for Science and Technology financed by the Malta Council for Science & Technology

Natural Science Foundation of Ningbo

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology,Transportation,Automotive Engineering

Link

http://xplorestaging.ieee.org/ielx7/6687316/7098407/10158735.pdf?arnumber=10158735

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of Environmental and Operating Conditions on Partial Discharge Activity in Electrical Machine Insulation: A Comprehensive Review;Energies;2024-08-11

2. Insulation Lifetime Evaluation of Electrical Machines Under Electrical Aging and Thermal Overload Transient;2024 IEEE 7th International Electrical and Energy Conference (CIEEC);2024-05-10

3. Insulation for Rotating Low-Voltage Electrical Machines: Degradation, Lifetime Modeling, and Accelerated Aging Tests;Energies;2024-04-23

4. Time-to-Failure Analysis of Short-Duty Cycle, Inverter-Fed Electrical Machines Exposed to Prevailing Electrical Stress;IEEE Transactions on Aerospace and Electronic Systems;2023-12

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