Analytical modeling and characterization of deep-submicrometer interconnect-Reference-Cited by-同舟云学术

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Analytical modeling and characterization of deep-submicrometer interconnect

Published:2001-05 Issue:5 Volume:89 Page:634-664
ISSN:0018-9219
Container-title:Proceedings of the IEEE
language:
Short-container-title:Proc. IEEE

Author:

Sylvester D.,Chenming Wu

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/5/20097/00929648.pdf?arnumber=929648

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