Embedded measurement system for non-destructive testing using new eddy currents planar array probe-Reference-Cited by-同舟云学术

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Embedded measurement system for non-destructive testing using new eddy currents planar array probe

Published:2014-05 Issue: Volume: Page:
ISSN:
Container-title:2014 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings
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Author:

Abrantes Ruben,Rosado Luis S.,Ramos Pedro M.,Piedade Moises

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/6845396/6860504/06860811.pdf?arnumber=6860811

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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