A New Cycle-consistent Adversarial Networks With Attention Mechanism for Surface Defect Classification With Small Samples
Author:
Affiliation:
1. School of Mechanical Engineering and Electronic Information, China University of Geosciences, Wuhan, China
2. State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China
Funder
National Natural Science Foundation of China
Major Special Science and Technology Project of Hubei Province
State Key Lab of Digital Manufacturing Equipment and Technology
Huazhong University of Science and Technology
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering
Link
http://xplorestaging.ieee.org/ielx7/9424/9906876/09760037.pdf?arnumber=9760037
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