Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
6 articles.
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1. EDT Bandwidth Management in SoC Designs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2012-12
2. Reduced ATE Interface for High Test Data Compression;2011 Sixteenth IEEE European Test Symposium;2011-05
3. Design and Optimization of Transparency-Based TAM for SoC Test;IEICE Transactions on Information and Systems;2010
4. System/Network-On-Chip Test Architectures;System-on-Chip Test Architectures;2008
5. TAM Design and Optimization for Transparency-Based SoC Test;25th IEEE VLSI Test Symmposium (VTS'07);2007-05