Author:
Liu Chunsheng,Chakrabarty Krishnendu,Jone Wen-Ben
Reference117 articles.
1. Digital Systems Testing and Testable Design;Abramovici,1994
2. Testability Concepts for Digital Ics: The Macro Test Approach;Beenker,1995
3. Interconnection Networks: An Engineering Approach;Duato,1997
4. Signal Integrity Effects in Custom IC and ASIC Designs,2002
5. Networks on chips: A new SOC paradigm;Benini;IEEE Computer,2002
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献