A 2-D Calibration Scheme for Resistive Nonvolatile Memories
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Published:2020-06
Issue:6
Volume:28
Page:1371-1377
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ISSN:1063-8210
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Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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language:
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Short-container-title:IEEE Trans. VLSI Syst.
Author:
Lee AlbertORCID,
Jagannathan RaahulORCID,
Wu DiORCID,
Wang Kang L.
Funder
Air Force Research Laboratory (AFRL) and the Defense Advanced Research Projects Agency
National Science Foundation
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software