Soft-Error-Aware SRAM With Multinode Upset Tolerance for Aerospace Applications-Reference-Cited by-同舟云学术

Soft-Error-Aware SRAM With Multinode Upset Tolerance for Aerospace Applications

Published:2024-01 Issue:1 Volume:32 Page:128-136
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Bai Na¹^ORCID,Xiao Xin¹^ORCID,Xu Yaohua¹^ORCID,Wang Yi¹^ORCID,Wang Liang¹^ORCID,Zhou Xinjie²

Affiliation:

1. Information Materials and Intelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei, China

2. China Electronics Technology Group Corporation No.58 Research Institute, Wuxi, China

Funder

Natural Science Foundation of the Anhui Higher Education Institutions of China

Open Research Fund of National Engineering Research Center for Agro-Ecological Big Data Analysis and Application, Anhui University

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

Reference20 articles.

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. A High Critical Charge 16T Soft-Error-Aware SRAM for Aerospace Applications;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10