Gate Delay Estimation With Library Compatible Current Source Models and Effective Capacitance-Reference-Cited by-同舟云学术

Gate Delay Estimation With Library Compatible Current Source Models and Effective Capacitance

Published:2021-05 Issue:5 Volume:29 Page:962-972
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Garyfallou Dimitrios^ORCID,Simoglou Stavros^ORCID,Sketopoulos Nikolaos^ORCID,Antoniadis Charalampos,Sotiriou Christos P.^ORCID,Evmorfopoulos Nestor,Stamoulis George

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/9416715/09382263.pdf?arnumber=9382263

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