Author:
Christie P.,Jose Pineda de Gyvez
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Cited by
5 articles.
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1. Overview of Wafer Contamination and Defectivity;Handbook of Silicon Wafer Cleaning Technology;2018
2. Manufacturability Aware Routing in Nanometer VLSI;Foundations and Trends® in Electronic Design Automation;2010
3. Design for manufacturing meets advanced process control: A survey;Journal of Process Control;2008-12
4. Overview of Wafer Contamination and Defectivity;Handbook of Silicon Wafer Cleaning Technology;2008
5. Multi-objective optimization of interconnect geometry;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2003-02