Modeling the Interdependences Between Voltage Fluctuation and BTI Aging-Reference-Cited by-同舟云学术

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Modeling the Interdependences Between Voltage Fluctuation and BTI Aging

Published:2019-07 Issue:7 Volume:27 Page:1652-1665
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Salamin Sami^ORCID,Van Santen Victor M.^ORCID,Amrouch Hussam^ORCID,Parihar Narendra,Mahapatra Souvik^ORCID,Henkel Jorg

Funder

Deutsche Forschungsgemeinschaft

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/8746725/08665917.pdf?arnumber=8665917

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