Device Aware Diagnosis for Unique Defects in STT-MRAMs-Reference-Cited by-同舟云学术

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Device Aware Diagnosis for Unique Defects in STT-MRAMs

Published:2023-10-14 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 32nd Asian Test Symposium (ATS)
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Author:

Aouichi Ahmed¹,Yuan Sicong¹,Fieback Moritz¹,Rao Siddharth²,Kim Woojin²,Marinissen Erik Jan²,Couet Sebastien²,Taouil Mottaqiallah¹,Hamdioui Said¹

Affiliation:

1. TU Delft,Delft,The Netherlands

2. IMEC,Leuven,Belgium

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10317938/10317940/10317952.pdf?arnumber=10317952

Reference33 articles.

1. DFT-Enhanced Test Scheme for Spin-Transfer-Torque (STT) MRAMs

2. Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault

3. Disturb neighborhood pattern sensitive fault

4. An experimental analysis of spot defects in SRAMs: realistic fault models and tests

5. Data Background-Based Test Development for All Interconnect and Contact Defects in RRAMs (in press);xun;ETS,0

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Device-Aware Diagnosis for Yield Learning in RRAMs;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25

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