Author:
Lo Wan-Yu,Chen Ching-Yi,Su Chin-Lung,Wu Cheng-Wen
Cited by
2 articles.
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1. Device Aware Diagnosis for Unique Defects in STT-MRAMs;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14
2. Testing of Non-volatile Logic-Based System Chips;2014 IEEE 23rd Asian Test Symposium;2014-11