A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Network Analyzer (Comments)-Reference-Cited by-同舟云学术

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A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Network Analyzer (Comments)

Published:1985-03 Issue:3 Volume:33 Page:286-287
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:en
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Van Lil E.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx6/22/25144/01133003.pdf?arnumber=1133003

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SPICE-Compatible Circuit Models of Multiports Described by Scattering Parameters with Arbitrary Reference Impedances;Electronics;2024-06-08

2. Reducing the Number of Measurements of a Multiport Circuit Using Covering Designs and Turán Systems;IEEE Microwave and Wireless Technology Letters;2023-02

3. An Embedded Common-Mode Filter and Mixed-Mode Scattering Parameters for the MIPI C-PHY Interface;IEEE Transactions on Electromagnetic Compatibility;2023

4. A More Efficient and Accurate Approach to Characterise an IC into Macro Model;Advances in Electrical and Electronic Engineering and Computer Science;2021

5. Scattered Reflections on Scattering Parameters — Demystifying Complex-Referenced S Parameters —;IEICE Transactions on Electronics;2016

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