A More Efficient and Accurate Approach to Characterise an IC into Macro Model
Author:
Publisher
Springer Singapore
Link
https://link.springer.com/content/pdf/10.1007/978-981-33-6490-5_7
Reference11 articles.
1. Tippet JC, Speciale RA (1985) A rigorous technique for measuring the scattering matrix of a multiport device with a two-port network analyzer (comments). IEEE Trans Microw Theory Tech 33(3):286–287
2. Kam DG, Kim J (2007) Multiport measurement method using a two-port network analyzer with remaining ports unterminated. IEEE Microw Wirel Compon Lett 17(9):694–696
3. Rolfes I, Schick B (2005) Multiport method for the measurement of the scattering parameters of N-ports. IEEE Trans Microw Theory Tech 53(6 II):1990–1996
4. Schutt-Ainé JE et al (2011) Comparative study of convolution and order reduction techniques for blackbox macromodeling using scattering parameters. IEEE Trans Compon Packag Manuf Technol 1(10):1642–1650
5. Deschrijver D, Gustavsen B, Dhaene T (2008) Computer code for fast macromodeling of large multiport systems. Electr Perform Electron Packaging, EPEP, pp 299–302
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