Author:
Huang Yu,Cheng Wu-Tung,Guo Ruifeng,Tai Ting-Pu,Kuo Feng-Ming,Chen Yuan-Shih
Cited by
15 articles.
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3. High Throughput Multiple Device Chain Diagnosis Methodology for Clock and Control Line Defects;2021 IEEE Microelectronics Design & Test Symposium (MDTS);2021-05-18
4. Scan Chain Diagnosis-Driven Test Response Compactor;2020 IEEE 29th Asian Test Symposium (ATS);2020-11-23
5. Improved Chain Diagnosis Methodology for Clock and Control Signal Defect Identification;2020 IEEE International Test Conference (ITC);2020-11-01